Self-calibrated Microwave Characterization of High-speed Optoelectronic Devices by Heterodyne Spectrum Mapping

Author(s)
S. Zhang; C. Zhang; H. Wang; X. Zou; Y. Zhang; Y. Liu; J. Bowers
Publication Image
Image of Schematic setup of the proposed self-calibrated frequency response measurement method
Publication Date
Publication Type
Journal
Journal/Conference Name
Journal of Lightwave Technology
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Research Areas
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