Estimation of roughness-induced scattering losses in III-nitride laser diodes with a photoelectrochemically etched current aperture

Author(s)
L. Megalini, R. Shenoy, K. Rose, J. P. Speck, J. E. Bowers, S. Nakamura, D. A. Cohen, and S. P. DenBaars
Publication Date
Publication Type
Journal
Journal/Conference Name
Phys. Status Solidi A
Indexing
213, No. 4, 953–957
Publication File