Estimation of roughness-induced scattering losses in III-nitride laser diodes with a photoelectrochemically etched current aperture

Author(s)

L. Megalini, R. Shenoy, K. Rose, J. P. Speck, J. E. Bowers, S. Nakamura, D. A. Cohen, and S. P. DenBaars

Publication Date

Fri, 01/01/2016 - 12:00

Publication Type

Journal

Journal/Conference Name

Phys. Status Solidi A

Indexing

213, No. 4, 953–957

Publication File

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